Electron Microprobe Laboratory

JXA-8530F Electron Microprobe

This laboratory consists primarily of a state-of-the-art JEOL JXA-8530F microprobe.  This field-emission instrument is the first of it's kind in Canada and provides superior imaging capabilities, greater range of accelerating voltages (5-30 keV), and exceptional beam stability over long analysis periods.
 Quantitative Elemental Analysis

Non-destructive, high-precision, high-accuracy micron to submicron scale point analysis with typical detection limits in the 100s to 10s of ppm.

Element mapping

Simultaneous EDS and WDS mapping can investigate the variability of several elements within a specimen in a single pass.


Panchromatic cathodoluminescence can reveal textures not visible by other imaging techniques.

Detectors available:

♦ 5 Wavelength Dispersive Spectrometers - Quantitative chemical analysis of elements from B to U, element maps

♦ 2 TAP, LDE1, LDE2, PETJ, LIF, PETH, LIFH, PETL, LIFL analyzing crystals.

♦ Silicon Drift Energy Dispersive Spectrometer - Rapid identification of mineral phases, qualitative element maps

♦ Backscattered Electron detector - Composition imaging

♦ Secondary Electron detector - Surface topography imaging

♦ Panchromatic Cathodoluminescence detector - Emitted visible light imaging

Samples Accommodated:

♦ Standard geological thin sections (27 mm x 46 mm)

♦ 25 or 32 mm round epoxy mounts

♦ Other sizes possible upon request

♦ For best results samples should be polished, flat and clean

♦ Most sample types must be carbon-coated prior to analysis