JEOL JCM-6000 Scanning Electron Microscope

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This laboratory consists of a JEOL JCM-6000 scanning electron microscope. This instrument provides quick and simple to operate secondary electron imaging (SEI) and backscatterd electron imaging (BSE) capabilities. An attached energy dispersive spectrometer (EDS) allows for qualitative and quantitative element analysis.  

Specifications:

♦ Secondary electron detector (SEI), up to 60,000x magnification.

♦ Backscatterd electron detector (BSE), up to 30,000x magnification.

♦ Energy dispersive spectrometer (EDS) for element point, line and mapping analysis.

♦ Low and high vacuum modes.

♦ 5 to 15 kV; variable beam currents.

Samples:

♦ Accomadates a variety of sample types with a maximum sample size of 7 cm diameter x 4 cm height.

♦ For best results under high vacuum, samples should be carbon coated prior to analysis.