Request Analysis
Please contact Josh Laughton (jlaught2@uwo.ca) or fill out a form below to arrange access and use of equipment.
JEOL JXA-8530F Electron Microprobe
JEOL JCM-6000 Scanning Electron Microscope
JEOL JXA-8530F Electron microprobe
bruker m4 tornado µICRO-xrf
JEOL JCM-6000 SCANNING ELectron microscope
