Request Analysis

Please contact Josh Laughton (jlaught2@uwo.ca) or fill out a form below to arrange access and use of equipment.


JEOL JXA-8530F Electron Microprobe

Bruker M4 Tornado Micro-XRF

JEOL JCM-6000 Scanning Electron Microscope


JEOL JXA-8530F Electron microprobe


bruker m4 tornado µICRO-xrf


JEOL JCM-6000 SCANNING ELectron microscope